ISO 14577-2:2026 Metallic materials — Instrumented indentation test for hardness and materials parameters — Part 2: Verification and calibration of testing machines规定塑料、橡胶与复合材料纳米压痕与微纳力学按该标准。
ISO 14577-4:2016 Metallic materials — Instrumented indentation test for hardness and materials parameters — Part 4: Test method for metallic and non-metallic coatings适用于涂料、胶黏剂与流体材料纳米压痕与微纳力学。
依据ISO 15989:2004 Plastics — Film and sheeting — Measurement of water-contact angle of corona-treated films开展仪器测试时,适用对象包括ISO 15989:2004用于高分子、胶黏剂与复合界面接触角与表面能的静态。
ISO 16000-42:2023 Indoor air — Part 42: Measurement of particle number concentration by condensation particle counters用于ISO 16000-42:2023用于气溶胶数量与质量浓度的气溶胶粒径分布的仪器测试。
ISO 16243:2011 Surface chemical analysis — Recording and reporting data in X-ray photoelectron spectroscopy (XPS)适用于XPS数据记录与报告。仪器测试按该标准执行记录激发源、分析器、通能、能量步长、荷电校正和谱图处理,形成保留原始谱、能量标定、峰参数、背景和定量字段。
ISO 16413:2020 Evaluation of thickness, density and interface width of thin films by X-ray reflectometry — Instrumental requirements, alignment and positioning, data collection, data analys。
依据ISO 16773-2:2016 Electrochemical impedance spectroscopy (EIS) on coated and uncoated metallic specimens — Part 2: Collection of data开展仪器测试时,适用对象包括电化学阻抗谱仪器分析 EIS按ISO 16773-2:2016采集涂漆和未涂。
ISO 16773-4:2017 Electrochemical impedance spectroscopy (EIS) on coated and uncoated metallic specimens — Part 4: Examples of spectra of polymer-coated and uncoated specimens规定频率响应与等效电路拟合按I。
ISO 17297:2025 Microbeam analysis — Focused ion beam application for TEM specimen preparation — Vocabulary规定聚焦离子束制备透射电镜试样术语相关的实施要求,内容包括按统一术语记录定位、沉积、切割、提取、安装和减薄步骤;项目交付保存制备位置、方向、厚度、离子条件和过程图像。
ISO 18221:2025 Microscopes — Microscopes with digital imaging displays — Information provided to the user regarding imaging performance规定ISO 18221:2025用于二维尺寸与几何测量中的数字显微成像性能描述相关的实施要求。
ISO 19214:2024 Microbeam analysis - Analytical electron microscopy - Method of determination for apparent growth direction of nanocrystals by transmission electron microscopy规定ISO 19214:202。
ISO 19318:2021 Surface chemical analysis - X-ray photoelectron spectroscopy - Reporting of methods used for charge control and charge correction规定ISO 19318:2021用于XPS全谱与元素定性的Surface che相关的实施。
依据ISO 19668:2017 Surface chemical analysis - X-ray photoelectron spectroscopy - Estimating and reporting detection limits for elements in homogeneous materials开展仪器测试时。
ISO 20263:2024 Microbeam analysis - Analytical electron microscopy - Method for the determination of interface position in the cross-sectional image of the layered materials规定ISO 20263:2024。